i2154
주요특징
- High Power & High Productivity Burn-in test Solution
- 기존 Burn-in Tester 사양 대비 6배 용량 증가로 효율성 증대
- Nand Memory Test 가능 (Option)
기본사양
- Target DevicesDRAM (DDR, Mobile, Graphic), Flash (Option)
- Test Speed20 MHz
- Digital Unit18,816 Ch/System
- Current Capacity360 A/Slot
- System2 Chamber, 4 Rack, 48 Slot
- Operation Temperature RangeRT~ 150℃
- Operating SystemLinux
- 거래처
- High Power & High Productivity Burn-in test Solution
- 기존 Burn-in Tester 사양 대비 6배 용량 증가로 효율성 증대
- Nand Memory Test 가능 (Option)
i2300
주요특징
- High Speed & High Accuracy Burn-in test Solution
- Embedded memory Tester with Burn-In system
- Site Operation Testing (48 Slot)
- Fail Memory & RA Option (Internal / External 지원)
기본사양
- Slot Count / Slot Pitch / Chamber24EA / 40mm / 1Chamber
- CapacityHOT & COLD : 7.5KW
- Temperature Range-10℃ ~150℃
- Temperature UniformityLess Than ±3℃
- Frequency200MHz
- Driver(A+S+C) / IO Driver1024Ch
- DPS Total220A per Slot
- Max Para20(X) x 16(Y) = 320Para @ 100Mhz↑
- 거래처
- High Speed & High Accuracy Burn-in test Solution
- Embedded memory Tester with Burn-In system
- Site Operation Testing (48 Slot)
- Fail Memory & RA Option (Internal / External 지원)