i2154
주요특징
- High Power & High Productivity Burn-in test Solution
- Embedded memory Tester with Burn-In system
- Site Operation Testing (48 Slot / 480 BIB Density)
기본사양
- Slot Count / Slot Pitch / Chamber 48EA / 40mm / 2Chamber
- CapacityHOT : 7.5KW per Chamber
- Temperature RangeRT~150℃
- Temperature UniformityLess Than ±3℃
- Frequency20MHz
- Driver(A+S+C) / IO Driver392Ch
- DPS Total360A per Slot
- Max Para.24(X) x 20(Y) = 480Para
- 거래처
- High Power & High Productivity Burn-in test Solution
- Embedded memory Tester with Burn-In system
- Site Operation Testing (48 Slot / 480 BIB Density)
i2300
주요특징
- High Speed & High Accuracy Burn-in test Solution
- Embedded memory Tester with Burn-In system
- Site Operation Testing (48 Slot)
- Fail Memory & RA Option (Internal / External 지원)
기본사양
- Slot Count / Slot Pitch / Chamber24EA / 40mm / 1Chamber
- CapacityHOT & COLD : 7.5KW
- Temperature Range-10℃ ~150℃
- Temperature UniformityLess Than ±3℃
- Frequency200MHz
- Driver(A+S+C) / IO Driver1024Ch
- DPS Total220A per Slot
- Max Para20(X) x 16(Y) = 320Para @ 100Mhz↑
- 거래처
- High Speed & High Accuracy Burn-in test Solution
- Embedded memory Tester with Burn-In system
- Site Operation Testing (48 Slot)
- Fail Memory & RA Option (Internal / External 지원)